Wafer Probe Station

Probe Station

  
   

Application

    • Electrical and electro-optical measurments
    • RF and Microwave
    • Parametric testing
    • Shielded/guarded/low noise characterization
    • High Z
    • Magnet-transport
    • Non-destructive, full wafer testin
    
Model
Max # of probe arms
Temp. range
Max sample size
Magnet Field

HFTTP4
4
2 K to 400 K
25mm (1") dia.
1T Horizontal
VFTTP4
4
2 K to 400 K
51mm (2") dia.
2.5T vertical
EMTTP4
4
10 K to 450 K
25mm (1") dia.
0.4 T horizontal
FWP6
6
4.5 K to 475 K
102mm (4") dia.
Not applicable
TTP6
6
3 K to 475 K
51mm (2") dia.
Not applicable
TTP4-1.5K
4
1.5 K to 475 K
25mm (1") dia.
Not applicable
TTP4
4
3 K to 475 K
51mm (2") dia.
Not applicable
   
 
Model HFTTP4
Model VFTTP4
Model TEMTTP4
Model FWP6
 
         
 
Model TTP6
Model TTP4-1.5K
Model TTP4