Scanning Probe Microscope (SPM) systems

Manufacture : Unisoku Scientific Instruments

USM-1100, UHV Ambient STM System

This system is applied for STM ovservation at ambient temperature. Variable temp. and AFM functions are available on request. STM System : USM-1100S AFM System : USM-1100A STM/AFM System: USM-1100SA

USM-1200, UHV Ultra Low Temperature SPM Systems

This system is applied for STM imaging andSTS spectroscopy at ultra low temperature down to 10K. AFM functions are available on customer's request

USM-1300 Series, Ultra Low Temperature STM system

This system is the most advanced STM system applied to the atomic scale imaging and tunnel spectroscopy at ultra or super low temp. range under high magnetic field (5,7,or 11T).

• Ultra low temperature STM System with Superconductor Magnet (USM-1300S4He, USM-1300S4HeVTI) : This system using LHe is designed for observation of the sample surface at a very LT of 4.2K. Offer this system with Variable temperature Insert to control the sample temperature in the range of 2K-50K
  
  
• Super low temperature STM system with Superconductor Magnet (USM1300S3He) : This system with 3He cryostat is capable of keeping the sample to observe at ultra-low temperature range from 4.2K to <0.4K

USM-1400 Series UHV Ultra Low Temperature SPM System

This system is adopted newly designed cryostat of which LHe reservoir is built under the SPM stage. It can be applied to various kinds of STM, AFM, SNOM, and their composite system

This configuration of the cryostat realizes the features:

• High stability of temperature
• Long holding time of LHe
• Ease of operation
• Compact design of total system.
  

Applications are as:

• USM-1400 S, Low Temperature STM system
  The compact integrated UHV system for STM and STS applications
  
  
• USM-1400 M, Low Temperature Multi-Mode SPM System
  STM, AFM and SNOM Modes are possible for a wide application of experiments in UHV and at ultra low temperature
  
  
• USM-1400-4P, Low Temperature 4-Probe System
  • 4-probe system realizes the local conductance measurement at ultra low temperature
  • 4 points measurement is possible for accurate conductivity measurement in micrometer to nanometer scale
  • Scanning electron microscope or Optical microscope can be installed
  • Image scanning is available on request
    

Scanning Hall Probe Microscopes

A unique quantitative and non-invasive instrument to measure surface magnetic fields at nanometer scale

• Image local magnetic fields with unprecedented sensitivity: upto 50nm spatial resolution ?7μT/?Hz @ 300K , 60nT/?Hz @ 77K, 60nT/?Hz @ 4K magnetic field resolution
• Quantitative : measure magnetic field values directly with nanometer resolution
• Non-invasive: ~0.40 Gauss self field
• Local magnetization measurements at nanometer scale B-H, M-H curves
• Real-Time scans (~1 frame/s) to investigate dynamic magnetic phenomena
• SHPM, STM, AFM operation with single instrument
• Compatible with PPMS from Quantum Design Inc
• Fits into almost ay cryostat, 23.6mm o.d.
• Simultaneous SHPM and STM operation
• SHPM operation in the lift-off mode
• Room Temperature(RT-SHPM) and Low Temperature (LT-SHPM)?versions are available

Room Temp.Scanning Hall Probe Microscope (RT-SHPM)

Low Temp. Scanning Hall Probe Microscope (LT-SHPM)

Imaging modes	SHPM, STM, AFM
Scan Size	Large area scan head	Standard scan head
	120x120μm@300K 32x32μm@77K 18x18μm@4.2K	52x52μm@300K 14x14μm@77K 6x6μm@4.2K
Z-range	7.0μm@300K 1.8μm@77K 0.8μm@4.2K	4.8μm@300K 1.2μm@77K 0.5μm@4.2K
Head Dimensions	23.6mm OD x 125mm	24.5m OD x 100mm
	Compatible with PPMS from Quantum Design
Sample approach	Stick-Slip type: 100mm Z, ?3mm XY range with 50-800nm step size, Optional: XY encoder
Sample size	15 x 15 x 5 mm maximum
Temp. range	mK-300K
Magnetid Field	>14T

Low Temp. Scanning Probe Miscroscope (LT-SPM)

A user-friendly Low Temperature Scanning probe Microscope for STM, AFM, SHPM, NSOM and other SPM experiments

• mK-300K operation
• Compatible with PPMS from Quantum Design Inc.
• Small size, 23.6mm or 25.4mm o.d.
• x,y & z coarse sample positioning